UV accessory selection guide for solids - Options

Since light cannot penetrate opaque (solid) samples, it is reflected on the surface of the samples.

With relative specular reflectance measurement, the reflectance is calculated from the strength ratio after comparing the light reflected from the reference sample with the light reflected from the measurement sample.

With absolute specular reflectance measurement, as shown in the figure, a reference sample is not used, the sample-free state (air) is set at 100%, and the reflection of the sample is simply applied to the 100% setting when measuring the sample.

The transmittance of thin samples such as film with little scattering can be measured by combining the film holder with the standard sample compartment.

This large-sample compartment enables transmission and reflection measurements of various-shaped samples.

This unit uses a lens and mask to mask the beam that passes through the integrating sphere opening.

This software calculates the color values of the measured object from the spectra obtained by the spectrophotometer.

This software calculates film thickness from the peak positions of the interference pattern caused by the film.

The SolidSpec-3700i/3700i DUV have three detectors which cover the range from ultraviolet to near-infrared. This product is equipped with LabSolutions UV-Vis software.

UV-3600i Plus, the Multi-purpose large-sample compartment and the Integrating sphere attachment also feature three detector, enabling the high-sensitivity measurement of solid samples. This product is equipped with LabSolutions UV-Vis software.